New Drift Detector Rolled Out by EDAX for Transmission Electron Microscopes

EDAX has launched the Apollo Silicon Drift Detector (SDD) Series, which can be used along with the transmission electron microscope (TEM).

The new series of detectors integrates data acquisition and signal processing into a single unit. This series consists of the Apollo XLT with a Super Ultra Thin Window (STUW) and a windowless version, which is the Apollo XLTW.

Sun Park added that the detector has an elegant design and comes with an improved performance, features and it is easy to install and operate. The detector series also allows remote control through the Ethernet from any computer.

The detector consists of a sensor measuring 30 mm² which provides improved collection efficiency when used in TEM applications. While detecting X-rays of low energy, the windowless series is very useful as it steps up the collection efficiency and also gives an increased sensitivity of almost 500%. With such improved performance parameters in the windowless version, the mapping speed and the detection of light is greatly enhanced.

The Apollo XLT SDD Series comes along with the TEAM Energy Dispersive Spectroscopy (EDS) software that is capable of providing analytical solutions for the TEMs. The Smart features in the software provide analytical intelligence, which is essential in giving good quality and reliable results. Smart Acquisition, Smart Phase Mapping and Smart Track are some of the Smart features in the EDS software. The EDS software is constructed with an advanced interface and hence the layout is unique and the display zone is optimized so as to facilitate easy reading of results and hassle free access to the features. The Expert ID and Mthin features have been added to the software in order to give optimized results while working on thin samples. The detector is sophisticatedly designed in such a way that it is easy to use and provides for better analysis of samples and its working is totally independent of the operator’s skill.