1st Detect, a miniature-mass spectrometer technology developer and a subsidiary company of Astrotech, has announced that a key patent has been issued by the European Patent Office (EPO) for 1st Detect’s unique chemical detection technology using a spectrometer ion trap.
The patent, titled "Driving a Mass Spectrometer Ion Trap or Mass Filter," signifies a technological advantage and enables the process optimization of an ion trap using efficient and compact circuitry.
The CEO of Astrotech and the Chairman of 1st Detect, Thomas B Pickens III stated that the patent for the ion trap technology is in conjunction with the patent number US 7,973,227 issued by the US Patent & Trademark Office on 5 July, 2011 and is an essential component of the company’s intellectual property portfolio. Pickens also added that the European market is important for the company’s detection technology and that the patent protects and stands testimony to the progress 1st Detect has achieved in the development of the Miniature Mass Spectrometer.
The President of 1st Detect and the inventor of the Patent (EU 2 301 061), David Rafferty explained that the patent protects the technology that supports the development of the advanced, yet affordable mass spectrometers for field applications and laboratory use.
The 1st Detect mini mass spectrometer is an affordable and portable device with the capability to detect various chemicals, vapors and residues from toxic chemicals, volatile organic compounds, chemical warfare agents, explosives and food & beverage contaminants. Its wide-ranging capabilities make the spectrometer best suited for applications in the security, research, healthcare, industrial and process flow markets.