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Results 1 - 10 of 53 for Force microscopy
  • What are Atomic Force Microscopy Stress Sensors?
    Article - 21 Feb 2020
    Atomic force microscopy, also known as AFM, is a high resolution procedure used to acquire images and other figures from a variation of materials.
  • NIST Force Sensor Detects Fluctuations in Ion Motions
    News - 6 Sep 2010
    The physicists of the National Institute of Standards and Technology (NIST) have exploited miniature ion crystals for measuring forces in the yoctonewton range. The yoctonewton (mass equivalent to...
  • BAS 3-D Silicon Micro Sensor for Measuring Magnetic Field
    News - 8 Jun 2010
    Currently designed 3-D Hall magnetic-field based silicon gadgets have important disadvantages, which include many contacts, a minimum of eight, thereby complicating the realization of the technology,...
  • Chromacity and Scientifica join Forces on Laser Microscopy
    News - 28 Oct 2019
    Chromacity has announced a product partnership with Scientifica, a leading supplier of laboratory equipment. The agreement means that Chromacity’s lasers are now offered as a light...
  • Polytec
    Supplier Profile
    At Polytec, we specialize in advanced optical measurement systems and cutting-edge testing services, all tailored to meet your unique needs. Our focus is your success. With a dedicated commitment to...
  • qPlus Sensors in Atomic Force Microscopy
    Article - 15 Mar 2022
    qPlus based AFM is known as the best method to study equipment and materials at ultralow temperatures as it allows examining and navigating even the nonconductive parts of the equipment and materials.
  • Using Sensors in Atomic Force Microscopy
    Article - 5 Dec 2018
    Atomic Force Microscopy (AFM) is a microscopy technique within the branch of scanning probe microscopy (SPM) that is used to obtain a topographic image of a specimen at nanometer (nm) resolution.
  • Anton Paar GmbH
    Supplier Profile
    100 years of Anton Paar A century: Great people | Great instruments The “Anton Paar” success story began on January 4, 1922, when Anton Paar started his metalworking shop. Back then, it...
  • Nu Nano Ltd
    Supplier Profile
    NuNano is a UK-based company specializing in the design and manufacture of probes for atomic force microscopy and cantilever-based sensor devices. It was founded in 2011 by Dr James Vicary and...
  • TA Instruments
    Supplier Profile
    TA Instruments designs and manufactures the world’s highest performing thermal analysis, rheometer, microcalorimeter, and mechanical test systems by focusing on four fundamental measurements:...

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